| Course code |
02 41 6118 01 |
| ECTS credits |
2 |
| Course name in language of instruction |
Microwave Measurement |
| Course name in Polish |
Microwave Measurement |
| Course name in English |
Microwave Measurement |
| Language of instruction |
English |
Type of classes
Teaching hours per semester |
|
Lecture |
Tutorials |
Laboratory |
Project |
Seminar |
Other |
E-learn. |
| Contact hours |
5 |
|
15 |
|
|
10 |
|
| Distance learning |
No |
No |
No |
No |
No |
No |
No |
| Weighted grades |
0.50 |
|
0.50 |
|
|
0 |
|
|
| Unit running the course |
Instytut Elektroniki |
| Course coordinator |
dr inż. Łukasz Januszkiewicz |
| Course instructors |
dr inż. Łukasz Januszkiewicz |
| Prerequisites |
subjects that the student previously had to pass:
Physics, Electric circuits |
| Course learning outcomes |
- Student understands the principle of microwave measurements
- Student is able to design selected microwave measuring systems
|
| Assessment methods |
Learning outcome 1 - verification by means of a multiple-choice test method, allowing to gain a total of 10 points.
Learning outcome 2 - verification based on the evaluation of the laboratory report, 10 points
|
| Programme learning outcomes |
|
| Grading policies |
To obtain the final credit, the following three conditions must be met simultaneously:
1. getting at least 5 points from the effect verification test 1.
2. getting at least 5 points. from the report verifying the effect of 2.
3. presence in laboratory classes
|
| Course content |
Lecture:
1. The phenomenon of signal reflection on impedance mismatch.
2. Scattering matrix, impedance matrix.
3. RF power measurement
4. Frequency measurement.
5. Reflectometry measurements.
6. Calibration of measuring instruments.
7. Analysis of errors and uncertainty of measurement.
Laboratory:
1 Virual VNA program operational manual.
2. Measurement of one port devices in the virtual VNA program.
3. Measurement of multi- port devices in the virtual VNA program.
4. Wavelength measurements using slot- line.
5. Measurements of impedance matching using a scalar analyzer.
6. Dual-port device measurements using a vector analyzer.
7. Measurements of material parameters.
|
| Basic reference materials |
159185
184230
1
J. Szóstka, Mikrofale : układy i systemy, Warszawa : Wydawnictwa Komunikacji i Łączności, 2006
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184230
2
R. Litwin, Technika mikrofalowa, Wydawnictwa Naukowo-Techniczne, 1972
159187
184230
3
W. Masiak, Teoria pola i mikrofale, Wydawnictwa Politechniki Warszawskiej, 1982
|
| Other reference materials |
159188
184230
1
W. Czarczyński, Podstawy techniki mikrofalowej, Oficyna Wydawnicza Politechniki Wrocławskiej, 2003.
159189
184230
2
W. Rosiński, Mikrofalowa elektronika półprzewodnikowa, Państwowe Wydaw. Naukowe, 1982.
|
Course workload
|
| Type of classes |
Teaching hours |
| Lecture |
5 |
| Laboratory |
15 |
| Other |
10 |
| Preparation of results obtained during laboratory classes |
15 |
| Preparation of the report |
15 |
| SUM : |
60 |
|
| Comments |
|
| Updated on |
2022-07-19 10:59:23 |